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Scanning Probe Microscopy as a Tool for Investigation of Biomaterials
Journal Title Advances in Electrical and Electronic Engineering
Journal Abbreviation AEEE
Publisher Group Technical University of Ostrava (VSB)
Website http://advances.utc.sk/index.php/AEEE
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Title Scanning Probe Microscopy as a Tool for Investigation of Biomaterials
Authors Tomanek, Pavel; Knapek, Alexandr; Novotna, Veronika; Safarova, Sarka
Abstract Super-microscopic techniques like scanning tunnelling microscopy, atomic force microscopy or scanning near-field optical microscopy allows investigate micro- and/or nano-scale surfaces and structures. In this paper, both Environmental scanning electron microscope (ESEM) and Scanning near field optical microscope (SNOM) have been applied to more closely study of biomaterials. The results of visualization of human osteo-sarcoma cell line (U2OS) are compared. SNOM and ESEM yield different, however, comparable and complementary information on studied biological samples.
Publisher Faculty of Electrical Engineering and Computer Science
Date 2012-12-29
Source Advances in Electrical and Electronic Engineering Vol 10, No 5 (2012): December
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