The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit
|
| Title | The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit |
| Authors | |
| Abstract | This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits. |
| Publisher | Faculty of Electrical Engineering and Computer Science |
| Date | 2010-06-30 |
| Source | Advances in Electrical and Electronic Engineering Vol 8, No 2 (2010): June |
| Rights | Authors who publish with this journal agree to the following terms:Authors retain copyright and grant the journal right of first publication with the work simultaneously licensed under a Creative Commons Attribution License that allows others to share the work with an acknowledgement of the works authorship and initial publication in this journal.Authors are able to enter into separate, additional contractual arrangements for the non-exclusive distribution of the journals published version of the work (e.g., post it to an institutional repository or publish it in a book), with an acknowledgement of its initial publication in this journal.Authors are permitted and encouraged to post their work online (e.g., in institutional repositories or on their website) prior to and during the submission process, as it can lead to productive exchanges, as well as earlier and greater citation of published work (See The Effect of Open Access). |