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Investigation of Defects as a Loading Impedance of Waveguide
Journal Title Advances in Electrical and Electronic Engineering
Journal Abbreviation AEEE
Publisher Group Technical University of Ostrava (VSB)
Website http://advances.utc.sk/index.php/AEEE
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Title Investigation of Defects as a Loading Impedance of Waveguide
Authors Faktorova, Dagmar; Majer, Jozef
Abstract The paper deals with non-destructive microwave measurement of metal defects exploiting the waveguide features at the defect shape evaluation, (e.g. quarter – waveguide transformer). As we notify in the foregoing article we have paid our attention to the non-destructive investigation of metal cracks in microwave region. In this article some results concerning their evaluations regarding to microwave access are shown. From the series of measurements we present that one giving information about possible behavior of a crack.
Publisher Faculty of Electrical Engineering and Computer Science
Date 2011-06-20
Source Advances in Electrical and Electronic Engineering Vol 6, No 1 (2007): March
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