X-Ray Diffractometry of Thin Layers - Possibilities and Problems
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| Title | X-Ray Diffractometry of Thin Layers - Possibilities and Problems |
| Authors | |
| Abstract | Efficieney of two deconvolution methods used in X-ray powder diffraction analysis is compared for thin films of Pd and Pt. The first method is the classical Stokes method and the second one is method of indirect deconvolution. But calculated integral breadth of Gauss and Cauchy components of Voigt function which describe the physical broadening are different. The analysis of the all found pheromones show that the method of indirect deconvolution gives more accurate results. |
| Publisher | Faculty of Electrical Engineering and Computer Science |
| Date | 2011-06-28 |
| Source | Advances in Electrical and Electronic Engineering Vol 4, No 2 (2005): June |
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